機器(委託対応)の詳細情報

Detailed Information of Equipment(Job Request)

Equipment and Job Request Information
Affiliation Chemical Analysis Div., Research Facility Center for Science and Technology
Category Limited Purpose Equipment
Equipment (Job Request) Snanning Probe Microscope(SPM)E-sweep
Supplier (Equipment type) Hitachi High-Tech Science (E-sweep)

Specification・Features

A scanning probe microscope (SPM) is a generic term for microscopes to detect various physical quantities acting between the probe and the sample and to measure the surface profile and properties of a micro-area. The basic scanning modes include atomic force microscopy (AFM) and a dynamic force mode (DFM),and the ”SIS mode” suitable for measurement of high aspect samples. The multifunction modes include friction force microscopy (FFM), magnetic force microscope (MFM), Kelvin force microscopy (KFM), Piezo-response microscopy(PRM), nano/pico current AFM, and scanning tunneling microscopy (STM). This instrument is equipped with environment control, which can control temperature and humidity in a vacuum and in a liquid. The machine has a ”RealTune” function that automatically sets the image with 1 click after setting the sample and the cantilever and making necessary setup.

[Sample size]
Height ・・・ 9 mm or less
Width ・・・ 30 mm or less
[Maximum in-plane scan range/maximum vertical displacement]
When a 20 µm scanner is used ・・・ XY: 20 µm × 20 µm/Z: approx. 1 µm
When a 100 µm scanner is used ・・・ XY: 100 µm × 100 µm/Z: approx. 10 µm
Date of installation: March 11, 2010
Installation site Research Facility Center for Science and Technology,Chemical Analysis Division 207
Remark
Research Accomplishment
Inquiry 利用相談はこちらより必要事項をご記入の上、お問い合わせください。
機器担当者 担当者:廣瀬(分析部門203室)
University-wide
Shared Use Rate
1,670 Yen / 30 min.
University-wide
Job Request Rate
5,330 Yen / hr.
Picture