機器(委託対応)の詳細情報

Detailed Information of Equipment(Job Request)

Equipment and Job Request Information
Affiliation R&D Center for Innovative Material Characterization (IMC)
Category Electron Microscopes
Equipment (Job Request) (Advanced SEM)Ultra-High-Resolution Schottky Scanning Electron Microscope SU7000
Supplier (Equipment type) Hitachi High-Technologies (SU7000)

Specification・Features

SU7000 is a high-performance, high-resolution scanning electron microscope.
An electron optics / detection system designed to simultaneously acquire multiple secondary electron signals and backscattered electron signals enables quick acquisition of a wide variety of signals from a wide-field entire image to a fine surface structure, and multi-channel signals, which can be displayed and saved at the same time. Furthermore, it is possible to operate in a low vacuum state, and it is possible to observe organic substances, biological samples, etc., which used to be difficult to observe with an electron microscope.
In addition, this equipment is equipped with EDX for composition analysis and EBSD equipment for structure analysis, which enables sophisticated analysis of materials.
It is expected that sharing this device will contribute to various researches including material characterization.
Installation site Project and Research Building 103
Remark
Research Accomplishment
Inquiry 利用相談はこちらより必要事項をご記入の上、お問い合わせください。
機器担当者 担当者:塔村
所属:イノベイティブ計測技術開発研究センター
University-wide
Shared Use Rate
単価 A: 3,680 円 / 30分
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