機器(委託対応)の詳細情報

Detailed Information of Equipment(Job Request)

Equipment and Job Request Information
Affiliation Chemical Analysis Div., Research Facility Center for Science and Technology
Category Electromagnetic Analyzers
Equipment (Job Request) Electron Probe Microanalyzer JXA-8530F(EPMA)
Supplier (Equipment type) JEOL (JXA-8530F Electron Probe Micro Analyzer)

Specification・Features

This is an instrument to analyze and observe constituent elements in a micro-area on the surface of a solid sample by measuring the wavelength and intensity of characteristics X-rays generated when an electron beam is directed at the surface of the sample. This instrument is equipped with a field emission gun (FE) and is able to perform elemental analysis of a microscopic area of 1 μm or smaller. The analyzer is used for element analysis and microstructure observation in a wide variety of fields, including metals, rocks, ceramics, and semiconductors.
[Range of elemental analysis] B-U [Accelerating voltage] 1-30 kV [Range of illumination current] 10-12 - 5x10-7A [Scanning magnification] 40-300,000
Date of installation: March 11, 2010
Installation site Research Facility Center for Science and Technology,Chemical Analysis Division 206
Remark
Research Accomplishment
Inquiry 利用相談はこちらより必要事項をご記入の上、お問い合わせください。
機器担当者 担当者:権田
University-wide
Shared Use Rate
1,810 Yen / 30 min.
University-wide
Job Request Rate
5,290 Yen / hr.
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